Study of the Resistive Switching Characteristics and Mechanisms of Pt/CeOx/TiN Structure for RRAM Applications

Author: Zhou Qigang   Zhai Jiwei  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.140, Iss.1, 2012-01, pp. : 16-22

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