Separation of Near Interface Regions From Central Bulk in a Ferroelectric Thin Film

By Chu D. P.   Zhang Z. G.   Migliorato P.   McGregor B. M.   Ohashi K.   Hasegawa K.   Shimoda T.  

Integrated Ferroelectrics, Vol. 50, Iss. 1, 2002-01 ,pp. : 171-180

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High Frequency LIMM - A Powerful Tool for Ferroelectric Thin Film Characterization

By Sandner T.   Suchaneck G.   Koehler R.   Suchaneck A.   Gerlach G.  

Integrated Ferroelectrics, Vol. 46, Iss. 1, 2002-01 ,pp. : 243-257

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Self-Polarization and Migratory Polarization in Thin-Film Ferroelectric Capacitor

By Pronin I. P.   Kaptelov E. Y.   Tarakanov E. A.   Sorokin L. M.   Afanasjev V. P.   Pankrashkin A. V.  

Integrated Ferroelectrics, Vol. 49, Iss. 1, 2002-01 ,pp. : 285-294

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Comparison of Materials for the Ferroelectric Thin Film to be Integrated into High Density FeRAMs

By BRUCHHAUS R.   MOON B.-K.   HILLIGER A.   NAGEL N.   YAMADA Y.   ITOKAWA H.   YAMAKAWA K.   KUNISHIMA I.   BEITEL G.  

Integrated Ferroelectrics, Vol. 64, Iss. 1, 2004-01 ,pp. : 115-124

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The Influence of Mismatch-Induced Field on Thin Ferroelectric Film Size Effects

By GLINCHUK M.   MOROZOVSKA A.   ELISEEV E.  

Integrated Ferroelectrics, Vol. 64, Iss. 1, 2004-01 ,pp. : 17-38

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