Fabrication and Characterization of (Bi,La)4Ti3O12 Films Using LaAlO3 Buffer Layers for MFIS Structures

Author: PARK BYUNG-EUN   ISHIWARA HIROSHI  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.62, Iss.1, 2004-01, pp. : 141-147

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