

Author: FURUKAWA T. KUROIWA T. FUJISAKI Y. SATO T. ISHIWARA H.
Publisher: Taylor & Francis Ltd
ISSN: 1058-4587
Source: Integrated Ferroelectrics, Vol.62, Iss.1, 2004-01, pp. : 171-176
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content










By Tang Minghua Zhou Yichun Zheng Xuejun Ye Zhi Cheng Chuanpin Hu Zenshun He J.
Integrated Ferroelectrics, Vol. 94, Iss. 1, 2007-10 ,pp. :