Piezoresponse Scanning Force Microscopy: What Quantitative Information Can We Really Get Out of Piezoresponse Measurements on Ferroelectric Thin Films

By Harnagea Catalin   Pignolet Alain   Alexe Marin   Hesse Dietrich  

Integrated Ferroelectrics, Vol. 44, Iss. 1, 2002-01 ,pp. : 113-124

Taylor & Francis Ltd

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Dielectric Properties of Irradiated Ferroelectric and Antiferroelectric Thin Films

By Bittner R.   Humer K.   Weber H. W.   Cakare L.   Sternberg A.   Lesnyh D. A.   Kulikov D. V.   Trushin Y. V.  

Integrated Ferroelectrics, Vol. 47, Iss. 1, 2002-01 ,pp. : 143-152

Taylor & Francis Ltd

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Superconducting FeSe_0.5Te_0.5 thin films: a morphological and structural investigation with scanning tunnelling microscopy and x-ray diffraction

By Gerbi A   Buzio R   Bellingeri E   Kawale S   Marrè D   Siri A S   Palenzona A   Ferdeghini C  

Superconductor Science and Technology, Vol. 25, Iss. 1, 2012-01 ,pp. : 12001-12004

IOP Publishing

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Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg_1/3Nb_2/3O3–0.15PbTiO₃ Thin Films by Scanning Force Microscopy

By Saranya D.   John Neena S.   Parui Jayanta   Krupanidhi S. B.  

Integrated Ferroelectrics, Vol. 134, Iss. 1, 2012-01 ,pp. : 39-47

Taylor & Francis Ltd

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Scanning probe recognition microscopy investigation of neural cell prosthetic properties

By Ayres Virginia M.   Chen Qian   Fan Yuan   Flowers Dexter A.   Meiners Sally A.   Ahmed Ijaz   Delgado-Rivera Roberto  

International Journal of Nanomanufacturing, Vol. 6, Iss. 1-4, 2010-08 ,pp. : 279-290

Inderscience Publishers

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