Local mechanical equilibrium conditions for interfaces and thin films of arbitrary shape *

Author： Rusanov Anatoly I.   Shchekin Aleksandr K.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3028

Source： Molecular Physics, Vol.103, Iss.21-23, 2005-11, pp. : 2911-2922

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Thermo-mechanical characterization of optical thin films filters deposited onto shape memory alloy micro-actuators

By  

Smart Materials and Structures, Vol. 23, Iss. 12, 2014-12 ,pp. : 125035-125042

IOP Publishing

Access to resources Recommend Favorite

HREM Characterization of Interfaces in Thin MOCVD Superconducting Films

By  

Le Journal de Physique IV, Vol. 05, Iss. C5, 1995-06 ,pp. : C5-927-C5-934

Edp Sciences

Access to resources Recommend Favorite

ELLIPSOMETRY OF THIN FILMS ON VAPOR-LIQUID INTERFACES

By  

Le Journal de Physique Colloques, Vol. 44, Iss. C10, 1983-12 ,pp. : C10-243-C10-245

Edp Sciences

Access to resources Recommend Favorite

Non-equilibrium critical behavior of Heisenberg thin films

By  

EPJ Web of Conference, Vol. 185, Iss. issue, 2018-07 ,pp. : 11005-11005

Edp Sciences

Access to resources Recommend Favorite

Super-high strength shape memory thin films

By  

Le Journal de Physique IV, Vol. 112, Iss. issue, 2003-10 ,pp. : 841-844

Edp Sciences

Access to resources Recommend Favorite