HREM Characterization of Interfaces in Thin MOCVD Superconducting Films

Publisher： Edp Sciences

E-ISSN： 1764-7177|05|C5|C5-927-C5-934

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.05, Iss.C5, 1995-06, pp. : C5-927-C5-934

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