Investigation of {111} stacking faults and nanotwins in epitaxial BaTiO 3 thin films by high-resolution transmission electron microscopy

By Lei C.H.   Jia C.L.   Siegert M.   Urban K.  

Philosophical Magazine Letters, Vol. 80, Iss. 6, 2000-06 ,pp. : 371-380

Taylor & Francis Ltd

Access to resources Recommend Favorite

High-resolution electron microscopy study of strained epitaxial La 0.7 Sr 0 .3 MnO 3 thin films

By Lebedev O. I.   Tendeloo G. Van   Amelinckx S.   Ju H. L.   Krishnan Kannan M.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 80, Iss. 3, 2000-03 ,pp. : 673-691

Taylor & Francis Ltd

Access to resources Recommend Favorite

Change in surface morphologies with pulsed-laser-deposition-temperature for SrTiO 3 and Ba 0.7 Sr 0.3 TiO 3 thin films on Pt electrodes

By Sugii N.   Takagi K.  

Thin Solid Films, Vol. 323, Iss. 1, 1998-06 ,pp. : 63-67

Elsevier

Access to resources Recommend Favorite

Structural and dielectric properties of Ba 0.7 Sr 0.3 TiO 3 thin films grown on thin Bi layer-coated Pt(111)/Ti/SiO 2 /Si substrates

By Yi W.-C.   Kalkur T.S.   Philofsky E.   Kammerdiner L.  

Thin Solid Films, Vol. 402, Iss. 1, 2002-01 ,pp. : 307-310

Elsevier

Access to resources Recommend Favorite

X-Ray diffraction line broadening by stacking faults in SrBi 2 Nb 2 O 9 /SrTiO 3 epitaxial thin films

By Boulle A.   Legrand C.   Guinebretiere R.   Mercurio J.P.   Dauger A.  

Thin Solid Films, Vol. 391, Iss. 1, 2001-07 ,pp. : 42-46

Elsevier

Access to resources Recommend Favorite