Extraction of Bias-Dependent Source and Gate Resistance From Measured S-Parameters Under All Bias Conditions

Author: Lin F.   Cao J.   Kooi P.S.   Leong M.S.  

Publisher: Taylor & Francis Ltd

ISSN: 1569-3937

Source: Journal of Electromagnetic Waves and Applications, Vol.11, Iss.8, 1997-01, pp. : 1103-1119

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Abstract