Effects of the Al2O3 interlayer in ZnO thin-film transistors fabricated via atomic layer deposition

Author: Kim Seong-Hyeon   Jeong Kwang-Seok   Lee Ga-Won   Lee Hi-Deok  

Publisher: Taylor & Francis Ltd

ISSN: 1598-0316

Source: Journal of Information Display, Vol.14, Iss.2, 2013-06, pp. : 61-65

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Abstract