Degradation behaviors of InGaN/GaN-based multiple quantum wells blue light-emitting diodes by chip size

Author: Ryu Jae-Hyoung   Lee Jin Hwan   Sun Woo Young   Cho Mee Ryoung  

Publisher: Taylor & Francis Ltd

ISSN: 1598-0316

Source: Journal of Information Display, Vol.14, Iss.4, 2013-12, pp. : 131-135

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