Electron-leakage-related low-temperature light emission efficiency behavior in GaN-based blue light-emitting diodes

Author: Dawei Yan   Lisha Li   Jian Ren   Fuxue Wang   Guofeng Yang   Shaoqing Xiao   Xiaofeng Gu  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.35, Iss.4, 2014-04, pp. : 44007-44010

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