Improving the quantification at high spatial resolution using a field emission electron microprobe
Publisher: IOP Publishing
ISSN: 1757-899X
Source: IOP Conference Series: Materials Science and Engineering, Vol.55, Iss.1, 2014-03, pp. : 153-168
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Electron microprobe analysis of cryolite
IOP Conference Series: Materials Science and Engineering, Vol. 55, Iss. 1, 2014-03 ,pp. :