Publisher: IOP Publishing
ISSN: 1757-899X
Source: IOP Conference Series: Materials Science and Engineering, Vol.37, Iss.1, 2012-07, pp. : 88-95
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Overview: Fine-Particle Characterization by Rietveld QXRD, CLM, and SEM-EDS Phase Mapping
By Hagni Ann M.
JOM, Vol. 54, Iss. 12, 2002-12 ,pp. :
Characterization of Glass Ceramics Produced from Natural and Waste Raw Materials
Solid State Phenomena, Vol. 2018, Iss. 271, 2018-02 ,pp. :