Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.100, Iss.5, 2008-03, pp. : 33-36
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Atomic force microscopy manipulation with ultrasonic excitation
Journal of Physics: Conference Series , Vol. 100, Iss. 5, 2008-03 ,pp. :
Interaction sensing in dynamic force microscopy
New Journal of Physics, Vol. 2, Iss. 1, 2000-03 ,pp. :
Controlled arrangement of FePt nanoparticles on Si substrate
Journal of Physics: Conference Series , Vol. 200, Iss. 7, 2010-01 ,pp. :
Ballistic electron emission microscopy of the Au-Si (100) interface
Journal de Physique III, Vol. 3, Iss. 12, 1993-12 ,pp. :