

Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.214, Iss.1, 2010-03, pp. : 4-10
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


Photocarrier radiometric study of defect states in semi-insulating GaAs
Journal of Physics: Conference Series , Vol. 214, Iss. 1, 2010-03 ,pp. :




Nondestructive deep-level diagnostic method for semi-insulating materials
By Il’ichev É.
Technical Physics, Vol. 43, Iss. 5, 1998-05 ,pp. :


Recent developments in the study of the EL2 defect in GaAs
Revue de Physique Appliquée (Paris), Vol. 23, Iss. 5, 1988-05 ,pp. :


On quantitative mapping of EL2 concentration in semi-insulating GaAs wafers
Journal de Physique III, Vol. 1, Iss. 9, 1991-09 ,pp. :