Publisher: IOP Publishing
ISSN: 1367-2630
Source: New Journal of Physics, Vol.7, Iss.1, 2005-05, pp. : 2198-2218
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
4Pi microscopy with negligible sidelobes
New Journal of Physics, Vol. 10, Iss. 4, 2008-04 ,pp. :
STED microscopy resolves nanoparticle assemblies
New Journal of Physics, Vol. 8, Iss. 6, 2006-06 ,pp. :
Sub-Abbe resolution: from STED microscopy to STED lithography
By Klar Thomas A Wollhofen Richard Jacak Jaroslaw
Physica Scripta, Vol. 2014, Iss. 162, 2014-09 ,pp. :
Towards quantitative magnetic force microscopy: theory and experiment
New Journal of Physics, Vol. 14, Iss. 4, 2012-04 ,pp. :