Publisher: IOP Publishing
E-ISSN: 1741-3540|32|1|16402-16404
ISSN: 0256-307X
Source: Chinese Physics Letters, Vol.32, Iss.1, 2015-01, pp. : 16402-16404
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Carrier behavior of HgTe under high pressure revealed by Hall effect measurement
Chinese Physics B, Vol. 24, Iss. 11, 2015-11 ,pp. :
Electrical resistivity measurements under high pressure for FeTe0.92
Journal of Physics: Conference Series , Vol. 200, Iss. 1, 2010-01 ,pp. :
Hall effect in CeAl2 under high pressure
Journal of Physics: Conference Series , Vol. 150, Iss. 4, 2009-03 ,pp. :