Effect of Schottky gate type and channel defects on the stability of transparent ZnO MESFETs

Publisher： IOP Publishing

E-ISSN： 1361-6641|30|2|24008-24017

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.30, Iss.2, 2015-02, pp. : 24008-24017

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