Effect of Schottky gate type and channel defects on the stability of transparent ZnO MESFETs
Publisher: IOP Publishing
E-ISSN: 1361-6641|30|2|24008-24017
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.30, Iss.2, 2015-02, pp. : 24008-24017
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Abstract