Complex investigation of multilayer nanostructure of a‐Si/SiO1.9 by probe and spectroscopic analysis techniques. Visualization of the band structure. Studying of the band structure of the suboxide border layers

Publisher： John Wiley & Sons Inc

E-ISSN： 1096-9918|47|4|498-505

ISSN： 0142-2421

Source： SURFACE AND INTERFACE ANALYSIS, Vol.47, Iss.4, 2015-04, pp. : 498-505

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