Chemical depth profiling and 3D reconstruction of III–V heterostructures selectively grown on non‐planar Si substrates by MOCVD

Publisher： John Wiley & Sons Inc

E-ISSN： 1862-6270|9|3|202-205

ISSN： 1862-6254

Source： PHYSICA STATUS SOLIDI - RAPID RESEARCH LETTERS (ELECTRONIC), Vol.9, Iss.3, 2015-03, pp. : 202-205

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Growth of III-V semiconductor layers on Si patterned substrates

By Gorbach T.Y. Holiney R.Y. Matveeva L.A. Smertenko P.S. Svechnikov S.V. Venger E.F. Ciach R. Faryna M.

Thin Solid Films, Vol. 336, Iss. 1, 1998-12 ,pp. : 63-68

Elsevier

Access to resources Recommend Favorite

Zn 3 P 2 thin films grown on glass substrates by MOCVD

By Kakishita K. Baba T. Suda T.

Thin Solid Films, Vol. 334, Iss. 1, 1998-12 ,pp. : 25-29

Elsevier

Access to resources Recommend Favorite

Morphology of the InAlAs/InP interface in the MBE-grown heterostructures analysed by SIMS depth profiling

By Herman M.A. Konarski P. Kozhukhov A.V. Obodnikov V.I.

Thin Solid Films, Vol. 267, Iss. 1, 1995-10 ,pp. : 114-120

Elsevier

Access to resources Recommend Favorite

Physics and Technology of III–V Heterostructures: Current Status and Trends in the Development

By Aseev A. L. Pchelyakov O. P. Toropov A. I.

Russian Physics Journal, Vol. 46, Iss. 6, 2003-06 ,pp. : 552-558

Springer Publishing Company

Access to resources Recommend Favorite

Studies of metamorphic III-V heterostructures by digital processing of HREM images

By Rocher A. Snoeck E.

Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 172-176

Elsevier

Access to resources Recommend Favorite