Influence of a Nanometric Al2O3 Interlayer on the Thermal Conductance of an Al/(Si, Diamond) Interface

Publisher: John Wiley & Sons Inc

E-ISSN: 1527-2648|17|1|68-75

ISSN: 1438-1656

Source: ADVANCED ENGINEERING MATERIALS (ELECTRONIC), Vol.17, Iss.1, 2015-01, pp. : 68-75

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Abstract