Facile Fabrication of Spherical Nanoparticle‐Tipped AFM Probes for Plasmonic Applications

Publisher： John Wiley & Sons Inc

E-ISSN： 1521-4117|32|2|182-187

ISSN： 0934-0866

Source： PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION (ELECTRONIC), Vol.32, Iss.2, 2015-02, pp. : 182-187

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