Experimental evidence of the photonic bandgap and defect effect in Si‐SiO2 multilayer structures

Publisher： John Wiley & Sons Inc

E-ISSN： 1521-4079|50|1|77-84

ISSN： 0232-1300

Source： CRYSTAL RESEARCH AND TECHNOLOGY (ELECTRONIC), Vol.50, Iss.1, 2015-01, pp. : 77-84

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