Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry

Publisher： John Wiley & Sons Inc

E-ISSN： 1098-2760|57|4|1006-1013

ISSN： 0895-2477

Source： MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, Vol.57, Iss.4, 2015-04, pp. : 1006-1013

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