Depth profiles and free volume in aircraft primer films

Publisher： IOP Publishing

E-ISSN： 1742-6596|618|1|109-114

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.618, Iss.1, 2015-06, pp. : 109-114

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

AES characterization and depth profiles measurements of AIN thin films on SiO2 substrates

By  

Le Journal de Physique IV, Vol. 03, Iss. C3, 1993-08 ,pp. : C3-171-C3-176

Edp Sciences

Access to resources Recommend Favorite

Depth profile study of polyaniline films by photoacoustic spectroscopy

By  

Le Journal de Physique IV, Vol. 125, Iss. issue, 2005-06 ,pp. : 63-65

Edp Sciences

Access to resources Recommend Favorite

Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution

By  

Journal of Physics: Conference Series , Vol. 190, Iss. 1, 2009-11 ,pp. : 619-630

IOP Publishing

Access to resources Recommend Favorite

Manganese depth-concentration profiles in ion-implanted silicon studied by Rutherford backscattering

By Égamberdiev B.   Adylov M.  

Technical Physics Letters, Vol. 27, Iss. 2, 2001-02 ,pp. : 168-170

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Depth profiles of metal ions implanted in dielectrics at low energies

By Stepanov A.   Zhikharev V.   Khaibullin I.  

Physics of the Solid State, Vol. 43, Iss. 4, 2001-04 ,pp. : 766-771

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite