Author： Liu Yong Kuang Cuifang Liu Xu
Publisher： IOP Publishing
E-ISSN： 2040-8986|17|4|45609-45616
ISSN： 2040-8986
Source： Journal of Optics, Vol.17, Iss.4, 2015-04, pp. : 45609-45616
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Abstract
We examine the use of azimuthally polarized sinh-Gauss beams in stimulated emission depletion (STED) microscopy. Based on the vectorial diffraction theory, the exciting and depleting fields produced by azimuthally polarized sinh-Gauss beams with different beam parameters have been presented and analyzed. The results show that azimuthally polarized sinh-Gauss beam can produce a steeper depleting pattern, and an exciting pattern without side lobes. It is thus helpful to achieve super resolution in STED microscopy.
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