The use of azimuthally polarized sinh-Gauss beam in STED microscopy

Author： Liu Yong   Kuang Cuifang   Liu Xu  

Publisher： IOP Publishing

E-ISSN： 2040-8986|17|4|45609-45616

ISSN： 2040-8986

Source： Journal of Optics, Vol.17, Iss.4, 2015-04, pp. : 45609-45616

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