Author： Zhiming Wang Hui Huang Zhifu Hu Zhuobin Zhao Xudong Wang Xiaobin Luo Jun Liu Songyuan Yang Xin Lü
Publisher： IOP Publishing
ISSN： 1674-4926
Source： Journal of Semiconductors, Vol.36, Iss.6, 2015-06, pp. : 64006-64009
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Abstract
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