Model of radiation-induced gain degradation of NPN bipolar junction transistor at different dose rates

Author: Qifeng Zhao   Yiqi Zhuang   Junlin Bao   Wei Hu  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.36, Iss.6, 2015-06, pp. : 64007-64010

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Abstract