Author: Ding Sun Shengzhi Xu Li Zhang Ze Chen Yang Ge Ning Wang Xuejiao Liang Changchun Wei Ying Zhao Xiaodan Zhang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.4, 2015-04, pp. : 44009-44012
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Abstract