A highly sensitive, direct and label-free technique for Hg2+ detection using Kelvin probe force microscopy

Author: Park Chanho   Jang Kuewhan   Lee Sangmyung   You Juneseok   Lee Soyoung   Ha Hyunsoo   Yun Kyungtak   Kim Junseop   Lee Howon   Park Jinsung   Na Sungsoo  

Publisher: IOP Publishing

E-ISSN: 1361-6528|26|30|305501-305507

ISSN: 0957-4484

Source: Nanotechnology, Vol.26, Iss.30, 2015-07, pp. : 305501-305507

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