Modeling accumulation capacitance-voltage characteristic of MoS2 thin flake transistors

Author： Hu Bo  

Publisher： IOP Publishing

E-ISSN： 1361-6641|30|5|55013-55016

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.30, Iss.5, 2015-05, pp. : 55013-55016

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