Improvements in the Quasi-static Capacitance–Voltage Characterization of Semiconductor–Insulator Interface States (Si/SiO₂)

Author： Gulyaev I. B. Zhdan A. G. Kukharskaya N. F. Tikhonov R. D. Chucheva G. V.

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7397

Source： Russian Microelectronics, Vol.33, Iss.4, 2004-07, pp. : 224-235

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