Optical characterization and density of states determination of silicon nanocrystals embedded in amorphous silicon based matrix

Author: van Sebille M   Vasudevan R A   Lancee R J   van Swaaij R A C M M   Zeman M  

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|32|325302-325310

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.32, 2015-08, pp. : 325302-325310

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