Use of a Ni Interlayer to Improve the Thermal Cycling Reliability of Cu/Sapphire Bilayers

Author: Lee Shao-Kuan   Tuan Wei-Hsing   Yang Tsong-Jen  

Publisher: Blackwell Publishing

E-ISSN: 1744-7402|12|3|685-692

ISSN: 1546-542X

Source: International Journal of Applied Ceramic Technology, Vol.12, Iss.3, 2015-05, pp. : 685-692

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content