Investigation of V-Ti/Al/Ni/Au Ohmic contact to AlGaN/GaN heterostructures with a thin GaN cap layer

Author: Sang Min Jung   Chang Taek Lee   Moo Whan Shin  

Publisher: IOP Publishing

E-ISSN: 1361-6641|30|7|75012-75017

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.30, Iss.7, 2015-07, pp. : 75012-75017

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content