Definitive Molecular Level Characterization of Defects in UiO‐66 Crystals

Publisher: John Wiley & Sons Inc

E-ISSN: 1521-3757|127|38|11314-11319

ISSN: 0044-8249

Source: ANGEWANDTE CHEMIE, Vol.127, Iss.38, 2015-09, pp. : 11314-11319

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Abstract