Publisher: John Wiley & Sons Inc
E-ISSN: 1551-2916|98|8|2587-2594
ISSN: 0002-7820
Source: JOURNAL OF THE AMERICAN CERAMIC SOCIETY, Vol.98, Iss.8, 2015-08, pp. : 2587-2594
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Enhanced light absorption in anodically etched silicon wafers
By Grigoras K. Krotkus A. Pacebutas V. Kavaliauskas J. Simkiene I.
Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. :
Surface Refining by Laser Scanning on Silicon Wafers
Materials Science Forum, Vol. 2015, Iss. 833, 2015-12 ,pp. :
Research on Surface Roughness of Acid Etched Silicon Wafers
Materials Science Forum, Vol. 2015, Iss. 815, 2015-05 ,pp. :
Mechanical losses of oscillators fabricated in silicon wafers
By Mitrofanov V P Prokhorov L G
Classical and Quantum Gravity, Vol. 32, Iss. 19, 2015-10 ,pp. :