Forming‐free resistive switching characteristics and improved reliability in sub‐stoichiometric NbNx films

E-ISSN： 1862-6270|9|4|264-268

ISSN： 1862-6254

Source： PHYSICA STATUS SOLIDI - RAPID RESEARCH LETTERS (ELECTRONIC), Vol.9, Iss.4, 2015-04, pp. : 264-268

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