Raman analysis of amorphous silicon ruthenium thin films embedded with nanocrystals

Publisher: John Wiley & Sons Inc

E-ISSN: 1097-4555|46|7|619-623

ISSN: 0377-0486

Source: JOURNAL OF RAMAN SPECTROSCOPY, Vol.46, Iss.7, 2015-07, pp. : 619-623

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Abstract