Measuring the Process Yield for Circular Profiles

E-ISSN： 1099-1638|31|4|579-588

ISSN： 0748-8017

Source： QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, Vol.31, Iss.4, 2015-06, pp. : 579-588

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Process Yield Analysis for Linear Within‐Profile Autocorrelation

QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, Vol. 748-8017, Iss. 6, 2015-10 ,pp. : 1053-1061

John Wiley & Sons Inc

Access to resources Recommend Favorite

Process Yield Analysis for Linear Within‐Profile Autocorrelation

QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, Vol. 31, Iss. 6, 2015-10 ,pp. : 1053-1061

John Wiley & Sons Inc

Access to resources Recommend Favorite

Spectral analysis for the effect of stylus tip curvature on measuring rough profiles

By Wu J.-J.

Wear, Vol. 230, Iss. 2, 1999-05 ,pp. : 194-200

Elsevier

Access to resources Recommend Favorite

Surface constrained plasticity: oxide rupture and the yield point process

By Kramer D.E. Yoder K.B. Gerberich W.W.

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 8, 2001-08 ,pp. : 2033-2058

Taylor & Francis Ltd

Access to resources Recommend Favorite

Yield‐Based Capability Index for Evaluating the Performance of Multivariate Manufacturing Process

QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, Vol. 31, Iss. 3, 2015-04 ,pp. : 419-430

John Wiley & Sons Inc

Access to resources Recommend Favorite