Simulation of the stress state of GaN‐AlN based epitaxial devices

Publisher: John Wiley & Sons Inc

E-ISSN: 1610-1642|12|4‐5|399-402

ISSN: 1862-6351

Source: PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Vol.12, Iss.4‐5, 2015-04, pp. : 399-402

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Abstract