X‐ray Scattering from Semiconductors and Other Materials. 3rd Ed. By Paul F. Fewster. Singapore: World Scientific Press, 2015. Pp. 493. Price GBP 65.00, USD 99.00. ISBN 9789814436922.

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|5|1610-1610

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.5, 2015-10, pp. : 1610-1610

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