Electron Microscopy and Spectroscopy on the Ultrafast Timescale

Publisher： John Wiley & Sons Inc

E-ISSN： 1439-7641|11|4|781-782

ISSN： 1439-4235

Source： CHEMPHYSCHEM, Vol.11, Iss.4, 2010-03, pp. : 781-782

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Advanced Electron Microscopy and Spectroscopy for Catalysis

By  

CHEMCATCHEM (ELECTRONIC), Vol. 7, Iss. 22, 2015-11 ,pp. : 3598-3600

John Wiley & Sons Inc

Access to resources Recommend Favorite

Lancaster delftware: a Raman spectroscopy, electron microscopy and Mössbauer spectroscopy compositional study

By  

JOURNAL OF RAMAN SPECTROSCOPY, Vol. 46, Iss. 12, 2015-12 ,pp. : 1265-1282

John Wiley & Sons Inc

Access to resources Recommend Favorite

Revealing the transient states of rapid solidification in aluminum thin films using ultrafast in situ transmission electron microscopy

By Kulovits Andreas  

Philosophical Magazine Letters, Vol. 91, Iss. 4, 2011-04 ,pp. : 287-296

Taylor & Francis Ltd

Access to resources Recommend Favorite

Time-Resolved Photoelectron Spectroscopy to Probe Ultrafast Charge Transfer and Electron Dynamics in Solid Surface Systems and at Metal- Molecule Interfaces

By Castiglioni Luca  

CHIMIA International Journal for Chemistry, Vol. 65, Iss. 5, 2011-05 ,pp. : 342-345

Swiss Chemical Society

Access to resources Recommend Favorite

Characterization of the interfacial region of epitaxial TlBiSe 2 thin films by infrared spectroscopy and transmission electron microscopy

By Mitsas C.L.   Polychroniadis E.K.   Siapkas D.I.  

Thin Solid Films, Vol. 353, Iss. 1, 1999-09 ,pp. : 85-92

Elsevier

Access to resources Recommend Favorite