Determinations of low atomic number elements in real uranium oxide samples using vacuum chamber total reflection X‐ray fluorescence

Publisher： John Wiley & Sons Inc

E-ISSN： 1097-4539|44|6|475-475

ISSN： 0049-8246

Source： X-RAY SPECTROMETRY, Vol.44, Iss.6, 2015-11, pp. : 475-475

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