

Publisher: John Wiley & Sons Inc
E-ISSN: 1600-5767|48|2|334-343
ISSN: 0021-8898
Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.2, 2015-04, pp. : 334-343
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Abstract
Recently, the concept of X‐ray diffraction contrast tomography (DCT) has been extended to the case of more widely available laboratory source CT systems. Using well known concepts from geometrical ray optics, an exact formulation is derived for the forward and backward projection geometry encountered under polychromatic cone beam illumination, and it is shown how this projection model can be efficiently implemented in practice. The new projection model is subsequently used for iterative tomographic reconstruction of the three‐dimensional shape of a grain from a set of experimentally observed cone beam projections and shows a clear improvement compared to the simplified projection model used previously.
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