The competitive growth of cubic domains in Ti1–xAlxN films studied by diffraction anomalous near‐edge structure spectroscopy

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|22|6|1440-1449

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.6, 2015-11, pp. : 1440-1449

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

High‐resolution X‐ray emission spectroscopy with transition‐edge sensors: present performance and future potential

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 3, 2015-05 ,pp. : 766-775

John Wiley & Sons Inc

Access to resources Recommend Favorite

CTM4DOC: electronic structure analysis from X‐ray spectroscopy

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 23, Iss. 5, 2016-09 ,pp. : 1264-1271

John Wiley & Sons Inc

Access to resources Recommend Favorite

Simultaneous X‐ray fluorescence and scanning X‐ray diffraction microscopy at the Australian Synchrotron XFM beamline

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 23, Iss. 5, 2016-09 ,pp. : 1151-1157

John Wiley & Sons Inc

Access to resources Recommend Favorite

Utilizing broadband X‐rays in a Bragg coherent X‐ray diffraction imaging experiment

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 23, Iss. 5, 2016-09 ,pp. : 1241-1244

John Wiley & Sons Inc

Access to resources Recommend Favorite

MISTRAL: a transmission soft X‐ray microscopy beamline for cryo nano‐tomography of biological samples and magnetic domains imaging

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 4, 2015-07 ,pp. : 1112-1117

John Wiley & Sons Inc

Access to resources Recommend Favorite