X‐ray spectroscopy for chemistry in the 2‐4 keV energy regime at the XMaS beamline: ionic liquids, Rh and Pd catalysts in gas and liquid environments, and Cl contamination in γ‐Al2O3

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|22|6|1426-1439

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.6, 2015-11, pp. : 1426-1439

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