Field ion and scanning tunnel microscopy studies of surface and bulk defects in carbon and silicon

Author: Suvorov A.   Cheblukov Yu.   Lazarev N.   Bobkov A.   Popov M.   Babaev V.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7842

Source: Technical Physics, Vol.45, Iss.3, 2000-03, pp. : 343-348

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