Formation of desired concentration profiles of embedded atoms and radiation-induced defects by using monochromatic fast ion beams

Author： Gusinskii G.   Matyukov A.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7842

Source： Technical Physics, Vol.47, Iss.5, 2002-05, pp. : 578-584

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